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Bibliography

Conference Paper (international conference)

Blur and affine moment invariants

Suk Tomáš, Flusser Jan

: Proceedings of the 16th International Conference on Pattern Recognition, p. 339-342 , Eds: Kasturi R., Laurendeau D., Suen C.

: IEEE Computer Society, (Los Alamitos 2002)

: International Conference on Pattern Recognition /16./, (Québec City, CA, 11.08.2002-15.08.2002)

: CEZ:AV0Z1075907

: GA102/00/1711, GA ČR

: blur, affine transform, moments

: http://library.utia.cas.cz/prace/20020053.ps

(eng): The paper is devoted to the recognition of objects and patterns deformed by imaging geometry as well as by unknown blurring. We introduce a new class of features invariant simultaneously to blurring by a centrosymmetric PSF and to affine transformation. As we prove in the paper, they can be constructed by combining affine moment invariants and blur invariants derived earlier. Combined invariants allow to recognize objects in the degraded scene without any restoration and geometric normalization.

: 09K

: JD