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K. Kimura
Kudo M., Kimura K., Haindl Michal, Tenmoto H.
:
Simultaneous Visualization of Samples, Features and Multi-Labels
,
Proceedings of the 23rd International Conference on Pattern Recognition (ICPR), p. 3592-3597,
23rd International Conference on Pattern Recognition ICPR 2016,
(Cancún, MX, 20161204) [2016]
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DOI:
10.1109/ICPR.2016.7900193